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CAP Home > CAP Reference Resources and Publications > cap_today/cap_today_index.html > CAP TODAY 2013 Archive > Touch Imprint/Crush Preparation—a new SAM course
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  Touch Imprint/Crush Preparation—a new SAM course

 

CAP Today

 

 

 

January 2013
Cytopathology And More

Barbara Blond, MBA, MT(ASCP)

Many pathology laboratories use touch imprint or crush preparations for rapid intraoperative evaluation/consultation to ensure that biopsy material obtained is from the target lesion, to obtain preliminary diagnosis/ intraoperative diagnosis, and to better triage the collected specimen.

The CAP Cytopathology Committee this year is providing a new educational online course on Intraoperative Touch Imprint/Crush Preparation. The online cases provide clinical history, radiological imaging, cytological and histological images that employ DigitalScope technology for whole-slide images, and ancillary testing where appropriate. This year’s cases focus on the central nervous system and lymph node pathology.

The Touch Imprint/Crush Prep-aration course is interactive, with immediate feedback on case-related adequacy assessment, ancillary study choices, and interpretation. The cases are presented in stages as follows:

  • The touch imprint whole-slide image (PDF, 1.6 KB) is presented, and the participant will be asked to make a general adequacy decision. After reading the clinical information and reviewing the slide, the participant is asked to make a general category diagnosis and provide decisions for ancillary studies based on the touch imprint findings.
  • The histology whole-slide image or other appropriate ancillary testing is presented to the participant. The participant indicates his or her choices of additional ancillary studies needed to provide a diagnosis. After indicating the studies and receiving feedback about whether the studies will contribute toward the diagnosis, the diagnosis is selected.

Pathologists, especially surgical pathologists and cytopathologists, and advanced cytotechnologists will benefit from this new TICP course. Up to 10 SAM/CME/CE credits annually can be claimed for completing the full program. The course can be ordered as TICP for the first kit/individual in the lab; TICP1 is used to order individual kits for each additional person in the laboratory at a reduced rate. Contact CAP customer service at 800-323-4040, option 1, to enroll.


Barbara Blond is technical manager, CAP Surveys, Northfield, Ill.
 
 
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