CAP ’13 – THE Pathologists’ Meeting – October 13 – 16, 2013™
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NEW  ST112  Understanding Sources of Bias in Diagnostic Accuracy Studies

Tuesday, October 15
4:30–5:30 PM
1.0 CME CREDIT

Practice-Based Learning and Improvement System Based Practice

Pathologists play an important role in producing and interpreting the information from diagnostic tests and diagnostic accuracy studies. It is important for pathologists to understand the sources of bias that appear in published accuracy estimates. This course will combine lecture with case illustrations from the literature to provide participants with the information needed to identify sources of bias in diagnostic accuracy studies and to predict the impact of the bias on accuracy estimates. These skills will help pathologists to critically appraise diagnostic accuracy studies and help researchers avoid common pitfalls in study designs.

You will learn to:

Faculty
Robert L. Schmidt, MD, PhD, MBA, FCAP

 

 

 

 

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